Microchip Technology Inc. today released a new generation of phase noise analyzer, product model 53100a. This phase noise tester can help researchers and manufacturing engineers measure frequency signals more accurately, including those generated by atomic clocks, as well as those generated by other high frequency reference modules and subsystems.
A new generation of phase noise analyzer, 53100a, is released today. This phase noise tester can help researchers and manufacturing engineers measure frequency signals more accurately, including those generated by atomic clocks, as well as those generated by other high frequency reference modules and subsystems.
The new 53100a phase noise analyzer is specially developed for engineers and researchers. Their work relies on accurate measurements of frequency signals from 5g networks, data centers, commercial and military aircraft, space vehicles, communications satellites, and Metrology and testing applications. This new test instrument can detect up to 200 MHz RF signal, quickly capture frequency signal, and quickly and accurately characterize phase noise, frequency jitter, Allen deviation (adev) and time deviation. It only needs one analyzer and a few minutes to characterize all the characteristics of the frequency concerned.
The new 53100a phase noise analyzer is specially developed for engineers and researchers. Their work relies on accurate measurements of frequency signals from 5g networks, data centers, commercial and military aircraft, space vehicles, communications satellites, and Metrology and testing applications. This new test instrument can detect up to 200 MHz RF signal, quickly capture frequency signal, and quickly and accurately characterize phase noise, frequency jitter, Allen deviation (adev) and time deviation. It only needs one analyzer and a few minutes to characterize all the characteristics of the frequency concerned.
The new 53100a phase noise analyzer is specially developed for engineers and researchers. Their work relies on accurate measurements of frequency signals from 5g networks, data centers, commercial and military aircraft, space vehicles, communications satellites, and Metrology and testing applications. This new test instrument can detect up to 200 MHz RF signal, quickly capture frequency signal, and quickly and accurately characterize phase noise, frequency jitter, Allen deviation (adev) and time deviation. It only needs one analyzer and a few minutes to characterize all the characteristics of the frequency concerned.
